Instrumentation


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Instrumentation

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JHU Surface Anaylsis Lab

Instrumentation and analytical techniques are at the heart of many of our projects which typically lie at the interface of chemistry, materials science, environmental engineering and nanoscience.

XPS (X-Ray Photoelectron Spectroscopy)

AFM (Atomic Force Microscopy)

PCS/DLS (Photon Correlation Spectroscopy/Dynamic Light Scattering)

IR/ATR-IR/RAIRS(Infrared Spectroscopy)

SFG (Sum Frequency Generation)

AES (Auger Electron Spectroscopy)

Mass Spectrometry

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