JHU Surface Anaylsis Lab
X-ray Photoelectron Spectrometer
Surface Composition
Elemental Oxidation State
Surface Composition
Scanning and Depth Profiling Capabilities
SEM imaging
For further information contact:
Mark Koontz
410-516-5335 (phone)
mkoontz@jhu.edu (e-mail)
X-ray Photoelectron Spectrometer |
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LEFT: XPS survey of C(1s) region for CF3(CF2)7(CH2)2SH adsorbed on Au showing different forms of Carbon
RIGHT: XPS survey of Ta(4f) region for Ta2O5 showing both oxidized and metallic Ta
Larger View
Scanning Auger Electron Spectrometer |
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