Equipment
X-ray Photoelectron Spectrometer
Surface Composition
Elemental Oxidation State
Surface Composition
Scanning and Depth Profiling Capabilities
SEM imaging
For further information contact:
Mark Koontz
410-516-5335 (phone)
mkoontz@jhu.edu (e-mail)
X-ray Photoelectron Spectrometer |
||
 |
 |
|
- Scientific Principle of X-ray Photoelectron Spectroscopy
- Capabilities:
- Elemental/Compositional Analysis of Surfaces (including Polymers)
- Surface Identification of Oxidation State and Local Environment
XPS full survey of CF3(CF2)7(CH2)2SH self-assembled monolayer adsorbed on gold Larger View
LEFT: XPS survey of C(1s) region for CF3(CF2)7(CH2)2SH adsorbed on Au showing different forms of Carbon
RIGHT: XPS survey of Ta(4f) region for Ta2O5 showing both oxidized and metallic Ta
Larger View
- Technical Specifics: 5400 XPS
Scanning Auger Electron Spectrometer |
|
 |
 |
- Scientific Principle of Auger Electron Spectroscopy
- Capabilities
- Elemental Composition of Solid Surfaces
- Surface Mapping
- Depth Profiling
- Secondary Electron Imaging
- Technical Specifics: PHI 610 Scanning Auger Microscope
Auger spectrum of an aluminum surface ion implanted with N2+ Larger View
Auger map of SiC surface sample imbedded with NiO particles
Left to right: secondary electron image Auger map of Nickel, Oxygen, Silicon
Larger View
Depth profile of nickel on silicon carbide before and after annealing Larger View
Secondary electron image of lead nanowire Larger View