Surface Analysis Laboratory
Room 7 Maryland Hall
Department of Materials
Science and Engineering
The Johns Hopkins University
Equipment (Purchased and maintained with help from RBD Instruments, Inc.)
Auger Electron Spectrometer
Surface Composition
Scanning and Depth Profiling Capabilities
SEM imaging
X-ray Photoelectron Spectrometer
Surface Composition
Elemental Oxidation State
For further information contact:
Mark Koontz
410-516-5335 (phone)
[email protected]
(e-mail)
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Scientific Principle of Auger Electron Spectroscopy
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Capabilities
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Elemental Composition of Solid Surfaces
Auger
spectrum of an aluminum surface ion implanted with N2+
Larger View
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Surface Mapping



Auger map of SiC surface sample imbedded with NiO particles
Left to right: secondary electron image Auger map of Nickel, Oxygen,
Silicon
Larger View
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Depth Profiling

Depth profile of nickel on silicon carbide before and after annealing
Larger View
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Secondary Electron Imaging
Secondary electron image
of lead nanowire
Larger View
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Technical Specifics: PHI 610 Scanning Auger Microscope
Scientific Principle of X-ray Photoelectron Spectroscopy
Capabilities:
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Elemental/Compositional Analysis of Surfaces (including Polymers)
XPS full survey
of CF3(CF2)7(CH2)2SH
self-assembled monolayer adsorbed on gold
Larger View
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Surface Identification of Oxidation State and Local Environment

LEFT: XPS survey of C(1s) region for CF3(CF2)7(CH2)2SH
adsorbed on Au showing different forms of Carbon
RIGHT: XPS survey of Ta(4f) region for Ta2O5 showing
both oxidized and metallic Ta
Larger View
Technical Specifics: 5100 XPS
Last Revised: May 5, 2000
Copyright © The Johns Hopkins University, Baltimore, USA